Publications

2 results at Annual Proceedings - Reliability Physics (Symposium)

Softening of breakdown in ultra-thin gate oxide nMOSFETs at low inversion layer density
- - S. Lombardo
  - F. Crupi
  - et al.
- 2001
- Annual Proceedings - Reliability Physics (Symposium)
Electrostatic discharge and high current pulse characterization of epitaxial-base silicon-germanium heterojunction bipolar transistors
- - S. Voldman
  - P. Juliano
  - et al.
- 2000
- Annual Proceedings - Reliability Physics (Symposium)