Publications

8 results at Microelectronics Journal

Assessment of structure variation in silicon nanowire FETs and impact on SRAM
- - Yi-Bo Liao
  - Meng-Hsueh Chiang
  - et al.
- 2012
- Microelectronics Journal
Comparison of transient and static test methods for chip-to-sink thermal interface characterization
- - B. Smith
  - T. Brunschwiler
  - et al.
- 2009
- Microelectronics Journal
Reducing parasitic BJT effects in partially depleted SOI digital logic circuits
- - Koushik K. Das
  - Ching-Te Chuang
  - et al.
- 2008
- Microelectronics Journal
Estimation of gate-to-channel tunneling current in ultra-thin oxide sub-50 nm double gate devices
- - Saibal Mukhopadhyay
  - Keunwoo Kim
  - et al.
- 2007
- Microelectronics Journal
Reading the footprints of strained islands
- - A. Rastelli
  - M. Stoffel
  - et al.
- 2006
- Microelectronics Journal
Hole transport in p-channel Si MOSFETs
- - Santhosh Krishnan
  - Dragica Vasileska
  - et al.
- 2005
- Microelectronics Journal
Quasi-bound states and resonances in heterostructures
- - P.J. Price
- 1999
- Microelectronics Journal
Role of molecular beam epitaxy in the field of optoelectronics
- - Heinz P. Meier
  - M. Kamp
  - et al.
- 1994
- Microelectronics Journal