Fully Automated Thermal Scanning Probe Lithography for FET Batch FabricationArmin KnollJana Chaabanet al.2022e-MRS Spring Meeting 2022
Electron Microscopy and EDS analysis of InGaAs-InP Heterointerfaces in Horizontal Nanowires Grown with the TASE ProcessEnrico BrugnolottoMarkus Scherreret al.2022e-MRS Spring Meeting 2022
Filamentary-based TaOx/HfO2 memristive synapsesTommaso StecconiYouri Popoffet al.2022e-MRS Spring Meeting 2022