Publications

3 results at IRPS 2017

A new and holistic modelling approach for impact of line-edge roughness on dielectric reliability
- - Ernest Y. Wu
  - Ramachandran Muralidhar
  - et al.
- 2017
- IRPS 2017
A stochastic model for impact of LER on BEOL TDDB
- - Ramachandran Muralidhar
  - Ernest Y. Wu
  - et al.
- 2017
- IRPS 2017
Comparison of DC and AC NBTI kinetics in RMG Si and SiGe p-FinFETs
- - Narendra Parihar
  - Richard G. Southwick
  - et al.
- 2017
- IRPS 2017