Publications

3 results at IEDM 1983

CHARACTERIZATION AND MODELING OF A LATCHUP-FREE 1- mu M CMOS TECHNOLOGY.
- - Y. Taur
  - W.H. Chang
  - et al.
- 1983
- IEDM 1983
STUDY OF AVALANCHE BREAKDOWN IN SCALED N-MOSFETS.
- - S.E. Laux
  - F.H. Gaensslen
- 1983
- IEDM 1983
SILICIDE FOR CONTACTS AND INTERCONNECTS.
- - C.-Y. Ting
- 1983
- IEDM 1983