Silicide formation in Ti-Si and Co-Si reactionsL. ClevengerQ.Z. Honget al.1993MRS Proceedings 1993Conference paper
Morphological transformations in the crystallization of TeSe-halide thin filmsA. BlatterC. Ortizet al.1993MRS Proceedings 1993Conference paper
Corrosion and protection of thin metallic filmsV. BrusicG.S. Frankel1993MRS Proceedings 1993Conference paper
Effect of annealing on the Cu distribution and Al2Cu precipitation in Al(Cu) thin filmsE.G. ColganK.P. Rodbellet al.1993MRS Proceedings 1993Conference paper
Spectromicroscopic study of corrosion in Al-Cu-Si metallizationV. Brusic1993MRS Proceedings 1993Conference paper
Elecromigration damage in fine Al alloy lines due to interfacial diffusionC.-K. HuM.B. Smallet al.1993MRS Proceedings 1993Conference paper
Theory of microstructure evolution in heterogeneous materialsS.T. Pantelides1993MRS Proceedings 1993Conference paper