Publications

2 results at INFOS 2005

Charge trapping and detrapping in HfO₂ high-κ MOS capacitors using internal photoemission
- - D. Felnhofer
  - E. Gusev
  - et al.
- 2005
- INFOS 2005
Conference paper
Interface state generation in pFETs with ultra-thin oxide and oxynitride on (100) and (110) Si substrates
- - J.H. Stathis
  - R. Bolam
  - et al.
- 2005
- INFOS 2005
Conference paper