Testing CMOS circuits at 50ps resolution with single-photon avalanche detectors
- S. Cova
- C. Porta
- et al.
- 2000
- ESSDERC 2000
Conference paper
Publications
2 results at ESSDERC 2000
The impact of SiGe BiCMOS technology on microwave circuits and systems
- M. Soyuer
- 2000
- ESSDERC 2000
Conference paper