Physical and predictive models of ultra thin oxide reliability in CMOS devices and circuits
- 2001
- IRPS 2001
Conference paper
Publications
5 results at IRPS 2001
Calculating the error in long term oxide reliability estimates
- B.P. Linder
- J.H. Stathis
- et al.
- 2001
- IRPS 2001
Conference paperIs product screen enough to guarantee low failure rate for the customer?
- M.W. Ruprecht
- G. La Rosa
- et al.
- 2001
- IRPS 2001
Conference paperPhysical and predictive models of ultra thin oxide reliability in CMOS devices and circuits
- 2001
- IRPS 2001
Conference paperCalculating the error in long term oxide reliability estimates
- B.P. Linder
- J.H. Stathis
- et al.
- 2001
- IRPS 2001
Conference paper