Publications

2 results at International Workshop on Stress-Induced Phenomena in Metallization 2005

Theory for electromigration failure in Cu conductors
- - J.R. Lloyd
  - C.E. Murray
  - et al.
- 2005
- International Workshop on Stress-Induced Phenomena in Metallization 2005
Thermal and electromigration-induced strains in polycrystalline films and conductor lines: X-ray microbeam measurements and analysis
- - G.S. Cargill III
  - L.E. Moyer
  - et al.
- 2005
- International Workshop on Stress-Induced Phenomena in Metallization 2005