Publications

3 results at IRPS 2007

Evaluation of SCR-based ESD protection devices in 90nm and 65nm CMOS technologies
- - James Di Sarro
  - Kiran Chatty
  - et al.
- 2007
- IRPS 2007
Role of Cu in TDDB of low-k dielectrics
- - J.R. Lloyd
  - S. Ponoth
  - et al.
- 2007
- IRPS 2007
Product burn-in stress impacts on SRAM array performance
- - Li Wang
  - Qiuyi Ye
  - et al.
- 2007
- IRPS 2007