On-chip timing uncertainty measurements on IBM microprocessorsR.L. FranchP. Restleet al.2008IEEE ITC 2008
Optical diagnostics for IBM POWER6 TM MicroprocessorPeilin SongStephen Ippolitoet al.2008IEEE ITC 2008
Analysis of retention time distribution of embedded DRAM - A new mMethod to characterize across-chip threshold voltage variationW. KongP. Parrieset al.2008IEEE ITC 2008