Publications

3 results at IEEE International SOI Conference 1992

Temperature sensitivity of devices and circuits fabricated in fully depleted accumulation mode CMOS/SOI
- - F.T. Brady
  - N. Haddad
  - et al.
- 1992
- IEEE International SOI Conference 1992
Hot-carrier reliability of fully depleted accumulation mode SOI MOSFETS
- - A. Acovic
  - L.K. Wang
  - et al.
- 1992
- IEEE International SOI Conference 1992
Effect of total dose radiation on device self latch-up
- - F.T. Brady
  - N. Haddad
  - et al.
- 1992
- IEEE International SOI Conference 1992