A test structure for characterizing local device mismatches
- Kanak Agarwal
- Frank Liu
- et al.
- 2006
- VLSI Circuits 2006
Conference paper
Publications
5 results at VLSI Circuits 2006
A low-power receiver with switched-capacitor summation DFE
- Azita Emami-Neyestanak
- Aida Varzaghani
- et al.
- 2006
- VLSI Circuits 2006
Conference paperA 3-transistor DRAM cell with gated diode for enhanced speed and retention time
- Wing K. Luk
- Jin Cai
- et al.
- 2006
- VLSI Circuits 2006
Conference paperA 5-mW 6-Gb/s quarter-rate sampling receiver with a 2-tap DFE using soft decisions
- Koon-Lun Jackie Wong
- Alexander Rylyakov
- et al.
- 2006
- VLSI Circuits 2006
Conference paperAn analog frontend chip for a MEMS-based parallel scanning-probe data-storage system
- Christoph Hagleitner
- Tony Bonaccio
- et al.
- 2006
- VLSI Circuits 2006
Conference paper