Publications

3 results at IEEE International SOI Conference 2011

Analysis of parasitic resistance in double gate FinFETs with different fin lengths
- - X. Yang
  - Kingsuk Maitra
  - et al.
- 2011
- IEEE International SOI Conference 2011
The future of SOI transistor technology
- - Bruce Doris
  - Ali Khakifirooz
  - et al.
- 2011
- IEEE International SOI Conference 2011
FINFET technology a substrate perspective
- - Huiming Bu
- 2011
- IEEE International SOI Conference 2011

Analysis of parasitic resistance in double gate FinFETs with different fin lengths