Stress induced charge trapping effects in SiO2/Al 2O3 gate stacks with TiN electrodes
- A. Kerber
- E. Cartier
- et al.
- 2003
- Journal of Applied Physics
Paper
Publications
2360 results at Journal of Applied Physics
Structure of low dielectric constant to extreme low dielectric constant SiCOH films: Fourier transform infrared spectroscopy characterization
- Alfred Grill
- Deborah A. Neumayer
- 2003
- Journal of Applied Physics
PaperNanometer precision metrology of submicron Cu/SiO2 interconnects using fluorescence and transmission x-ray microscopy
- Guangyong Xu
- D.E. Eastman
- et al.
- 2003
- Journal of Applied Physics
PaperOptical anisotropy effects in magneto-optic memory materials
- J.T. Jacobs
- D. Treves
- 2003
- Journal of Applied Physics
PaperMonte Carlo simulation of response of a semiconductor to periodic perturbations
- Paul A. Lebwohl
- 2003
- Journal of Applied Physics
PaperTheory of domain-wall motion in magnetic films and platelets
- J.C. Slonczewski
- 2003
- Journal of Applied Physics
PaperDynamic behavior of Josephson tunnel junctions in the subnanosecond range
- H.H. Zappe
- K.R. Grebe
- 2003
- Journal of Applied Physics
PaperCorrection of eddy current errors in electron beam deflection
- G.A. Wardly
- 2003
- Journal of Applied Physics
PaperPreparation and properties of nonstoichiometric MnAlGe thin films
- Kenneth Lee
- Erich Sawatzky
- et al.
- 2003
- Journal of Applied Physics
PaperKinetics of the formation of hafnium silicides on silicon
- J.F. Ziegler
- J.W. Mayer
- et al.
- 2003
- Journal of Applied Physics
Paper