Quantitative time‐of‐flight secondary ion mass spectrometry of a perfluorinated polyether
- David E. Fowler
- Roboert D. Johnson
- et al.
- 2004
- Surface and Interface Analysis
Publications
3537 results for Materials Discovery
Investigation of gallium arsenide multilayer structures using a tunnelling microscope combined with a UHV‐SEM
- O. Albrektsen
- H. Salemink
- 2004
- Surface and Interface Analysis
Influence of the bombarding ion energy and surface composition on the ground‐state atom fraction in solids analysis using multiphoton resonance ionization
- David L. Pappas
- David M. Hrubowchak
- et al.
- 2004
- Surface and Interface Analysis
Electric‐field‐induced room‐temperature doping in CuInSe2
- Abram Jakubowicz
- Geula Dagan
- et al.
- 2004
- Advanced Materials
Ultrafast electron dynamics at semiconductor surfaces and interfaces studied with subpicosecond laser photoemission
- R. Haight
- M. Baeumler
- et al.
- 2004
- Surface and Interface Analysis
Interfacial reactions between Al and RuO2, MoOx and WNx diffusion barriers on Si
- S.-E. Hörnström
- A. Charai
- et al.
- 2004
- Surface and Interface Analysis
Ferroelectric liquid crystalline polysiloxanes with high spontaneous polarization and possible applications in nonlinear optics
- Heinrich Kapitza
- Rudolf Zentel
- et al.
- 2004
- Advanced Materials
On the role of Gibbsian segregation in causing preferential sputtering
- Roger Kelly
- 2004
- Surface and Interface Analysis
Polysilanes—a new look at some old materials
- Robert D. Miller
- 2004
- Advanced Materials
Surface modification with lasers
- Paul B. Comita
- 2004
- Advanced Materials