X-ray study of interdiffusion in bimetallic CuSingle Bond signAu films
- K.N. Tu
- B.S. Berry
- 2003
- Journal of Applied Physics
Paper
Publications
2360 results at Journal of Applied Physics
Technique for determining concentration profiles of boron impurities in substrates
- J.F. Ziegler
- G.W. Cole
- et al.
- 2003
- Journal of Applied Physics
PaperPositive-ion bombardment of substrates in rf diode glow discharge sputtering
- J.W. Coburn
- Eric Kay
- 2003
- Journal of Applied Physics
PaperX-ray topographic determination of the absence of lateral strains in ion-implanted silicon
- K.N. Tu
- P. Chaudhari
- et al.
- 2003
- Journal of Applied Physics
PaperGas analysis in films by laser-induced flash evaporation followed by mass spectrometry
- Harold F. Winters
- Eric Kay
- 2003
- Journal of Applied Physics
PaperThe structure of electroplated and vapor-deposited copper films
- A. Gangulee
- 2003
- Journal of Applied Physics
PaperA study of the initial photocurrent due to pulsed light absorbed in finite thickness
- H. Seki
- 2003
- Journal of Applied Physics
PaperA comparison of ferromagnetic resonance with magnetic moment and x-ray film thickness measurements for thin Permalloy films
- C.H. Bajorek
- C.H. Wilts
- 2003
- Journal of Applied Physics
ReviewStructure of low dielectric constant to extreme low dielectric constant SiCOH films: Fourier transform infrared spectroscopy characterization
- Alfred Grill
- Deborah A. Neumayer
- 2003
- Journal of Applied Physics
PaperElectromigration induced resistance decrease in Sn conductors
- J.R. Lloyd
- 2003
- Journal of Applied Physics
Paper