Publications

3493 results for Materials Discovery

Investigation of gallium arsenide multilayer structures using a tunnelling microscope combined with a UHV‐SEM
- - O. Albrektsen
  - H. Salemink
- 2004
- Surface and Interface Analysis
Ultrafast electron dynamics at semiconductor surfaces and interfaces studied with subpicosecond laser photoemission
- - R. Haight
  - M. Baeumler
  - et al.
- 2004
- Surface and Interface Analysis
Chromium chromate as an inert marker in copper oxidation
- - Robert J. Day
  - Margaret A. Frisch
- 2004
- Surface and Interface Analysis
Study of near‐surface disorder and surface residues after reactive Ion etching of Silicon
- - G.S. Oehrlein
  - G.J. Coyle
  - et al.
- 2004
- Surface and Interface Analysis
Mechanism of silicon surface roughening by reactive ion etching
- - Gottlieb S. Oehrlein
  - Robert G. Schad
  - et al.
- 2004
- Surface and Interface Analysis
Interfacial reactions between Al and RuO₂, MoO_x and WN_x diffusion barriers on Si
- - S.-E. Hörnström
  - A. Charai
  - et al.
- 2004
- Surface and Interface Analysis
Advanced Materials R & D—Planning for the Future
- - James Economy
- 2004
- Advanced Materials
Voltage contrast XPS—a novel scheme for spatially resolved XPS studies
- - John J. Boland
- 2004
- Surface and Interface Analysis
Quantitative time‐of‐flight secondary ion mass spectrometry of a perfluorinated polyether
- - David E. Fowler
  - Roboert D. Johnson
  - et al.
- 2004
- Surface and Interface Analysis
A possible solution to the problem of compositional change with ion‐bombarded oxides
- - Imre Bertóti
  - Roger Kelly
  - et al.
- 2004
- Surface and Interface Analysis