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- 2008
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Conference paper
Publications
26856 results for Science
Controlling linewidth roughness in step and flash imprint lithography
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- 2008
- EMLC 2008
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- 2008
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- Archan Misra
- et al.
- 2008
- SPIE Defense + Security 2008
Conference paperEvent matching using the transitive closure of dependency relations
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- Vittorio Castelli
- 2008
- ACL 2008
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- José Gomes
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- 2007
- IDETC-CIE 2007
Conference paperA model-driven development approach to integrating requirements, design and simulations in the early stages of product development
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- 2007
- IDETC-CIE 2007
Conference paperWhat causes a system to satisfy a specification
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- Joseph Y. Halpern
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- 2008
- ACM TOCL
PaperA domain specific interconnect for reconfigurable computing
- Sanjay Rajopadhye
- Gautam
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- 2008
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PaperReal-space strain mapping of SOI features using microbeam X-ray diffraction
- Conal E. Murray
- S. Polvino
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- 2008
- Powder Diffraction
Paper