The P300: An approach to automated inspection of patterned wafers
- Virginia Brecher
- Raymond Bonner
- et al.
- 1989
- Proceedings of SPIE 1989
Conference paper
Publications
9277 results for Computer Science
Parameters associated with fabrication of an improved direct negative and plate: Methods and measurements
- K. Pennington
- E. Simonyi
- et al.
- 1989
- SPIE OE/LASE 1989
Conference paperOverview of thermal ink jet technology
- Francis C. Lee
- 1989
- Proceedings of SPIE 1989
Conference paperHigh quality halftone image printing using resistive ribbon thermal transfer printing
- D. Manzer
- R. Lane
- et al.
- 1989
- Proceedings of SPIE 1989
Conference paperImproved materials for fabrication of direct negatives and plates by electro-erosion printing
- A. Afzali
- M. Desai
- et al.
- 1989
- SPIE OE/LASE 1989
Conference paperLight scattering from ultrathin Si and Ge layers
- James C. Tsang
- 1989
- Proceedings of SPIE 1989
Conference paperAn improvement of Goldberg, Plotkin and Vaidya's maximal node-disjoint paths algorithm
- Kazuo Iwano
- 1989
- Information Processing Letters
PaperDictionaries, dictionary grammars and dictionary entry parsing
- Mary S. Neff
- Branimir K. Boguraev
- 1989
- ACL 1989
Conference paperOn computing the closest boundary point on the convex hull
- Alok Aggarwal
- Michael Hawrylycz
- 1989
- Information Processing Letters
PaperMaximal selection in tandem networks with symmetric hearing range
- Jeffrey M. Jaffe
- Zvi Rosberg
- 1989
- Algorithmica
Paper