Dynamic Effects in Josephson Devices Operated as Logic Gates
- Werner Baechtold
- 1979
- IEEE JSSC
Paper
Publications
121 results at IEEE JSSC
1, μm MOSFET VLSI Technology: Part IV-Hot-Electron Design Constraints
- Tak H. Ning
- Peter W. Cook
- et al.
- 1979
- IEEE JSSC
Paper1 µm MOSFET VLSI Technology: Part I-An Overview
- Dale L. Critchlow
- Arnold Reisman
- et al.
- 1979
- IEEE JSSC
Paper1 µm MOSFET VLSI Technology: Part VIII-Radiation Effects
- John M. Aitken
- 1979
- IEEE JSSC
PaperModel for a 15 ns 16K RAM with Josephson Junctions
- William Kotyczka
- Pierre Gueret
- et al.
- 1979
- IEEE JSSC
Paper1 µm MOSFET VLSI Technology: Part VII-Metal Silicide Interconnection Technology—A Future Perspective
- Billy L. Crowder
- Stanley Zirinsky
- 1979
- IEEE JSSC
PaperHot-Electron Emission in N-Channel IGFET's
- Tak H. Ning
- Ronald R. Troutman
- 1979
- IEEE JSSC
PaperSimple Analytical Models for the Temperature Dependent Threshold Behavior of Depletion-Mode Devices
- Fritz H. Gaensslen
- 1979
- IEEE JSSC
PaperA Study in the Use of PLA-Based Macros
- Peter W. Cook
- Chung W. Ho
- et al.
- 1979
- IEEE JSSC
PaperLogic Gates with Shaped Josephson Junctions
- Andreas Moser
- 1979
- IEEE JSSC
Paper