Physical model of the impact of metal grain work function variability on emerging dual metal gate MOSFETs and its implication for SRAM reliability
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- IEDM 2009
Conference paper
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26858 results for Science
1D Broken-gap tunnel transistor with MOSFET-like on-currents and sub-60mV/dec subthreshold swing
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Conference paperQuantifying the value of collaboration in supply chain management through business process simulation
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- Venkatesan Guruswami
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- 2009
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Conference paperArchitecture-driven variation analysis for designing cloud applications
- Liang-Jie Zhang
- Jia Zhang
- 2009
- ICCCBDA 2009
Conference paperScalable matching of industry models - A case study
- Brian Byrne
- Achille Fokoue
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- OM 2009
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- ICCCBDA 2009
Conference paper