Picosecond photoelectron microscope for high-speed testing of integrated circuits
- P.G. May
- Y. Pastol
- et al.
- 1990
- IBM J. Res. Dev
Publications
745 results at IBM J. Res. Dev
Picosecond noninvasive optical detection of internal electrical signals in flip-chip-mounted silicon integrated circuits
- H. Heinrich
- 1990
- IBM J. Res. Dev
Surface and interfacial energies of CoSi2 and Si films. Implications regarding formation of three-dimensional silicon-silicide structures
- K.N. Tu
- 1990
- IBM J. Res. Dev
Low-temperature Si and Si:Ge epitaxy by ultrahigh-vacuum/chemical vapor deposition. Process fundamentals
- B.S. Meyerson
- 1990
- IBM J. Res. Dev
Critical current measurements in single crystals and single-grain boundaries in YBa2Cu3O7 films
- P. Chaudhari
- D. Dimos
- et al.
- 1989
- IBM J. Res. Dev
Tl-Ca-Ba-Cu-O superconducting oxides
- R. Beyers
- S.S.P. Parkin
- et al.
- 1989
- IBM J. Res. Dev
Memory effects in YBa2Cu3O7-δ single crystal
- C. Rossel
- Y. Maeno
- et al.
- 1989
- IBM J. Res. Dev
Geometric tolerancing: I. Virtual boundary requirements
- Rangarajan Jayaraman
- Vijay Srinivasan
- 1989
- IBM J. Res. Dev
Architecture, design, and operating characteristics of a 12-ns CMOS functional cache chip
- R.E. Matick
- Robert Mao
- et al.
- 1989
- IBM J. Res. Dev
Critical temperature and the Ginzburg-Landau theory of layered high-temperature superconductors
- T. Schneider
- 1989
- IBM J. Res. Dev