Picosecond photoelectron microscope for high-speed testing of integrated circuits
- P.G. May
- Y. Pastol
- et al.
- 1990
- IBM J. Res. Dev
Paper
Publications
745 results at IBM J. Res. Dev
Picosecond photoemission probing of integrated circuits. Capabilities, limitations, and applications
- R. Clauberg
- H. Beha
- et al.
- 1990
- IBM J. Res. Dev
PaperLow-temperature Si and Si:Ge epitaxy by ultrahigh-vacuum/chemical vapor deposition. Process fundamentals
- B.S. Meyerson
- 1990
- IBM J. Res. Dev
PaperSurface chemistry of the WF6-based chemical vapor deposition of tungsten
- M.L. Yu
- K.Y. Ahn
- et al.
- 1990
- IBM J. Res. Dev
PaperLanthanide gallate perovskite-type substrates for epitaxial, high-Tc superconducting Ba2YCu3O7-δ films
- E.A. Giess
- R.L. Sandstrom
- et al.
- 1990
- IBM J. Res. Dev
PaperDiamondlike carbon films by rf plasma-assisted chemical vapor deposition from acetylene
- A. Grill
- B.S. Meyerson
- et al.
- 1990
- IBM J. Res. Dev
PaperCellular automata circuits for built-in self-test
- P.D. Hortensius
- R.D. McLeod
- et al.
- 1990
- IBM J. Res. Dev
PaperSimulation of embedded memories by defective hashing
- Leendert M. Huisman
- 1990
- IBM J. Res. Dev
PaperOn-chip wiring for VLSI. Status and directions
- M.B. Small
- D.J. Pearson
- 1990
- IBM J. Res. Dev
PaperPicosecond noninvasive optical detection of internal electrical signals in flip-chip-mounted silicon integrated circuits
- H. Heinrich
- 1990
- IBM J. Res. Dev
Paper