Picosecond photoelectron microscope for high-speed testing of integrated circuits
- P.G. May
- Y. Pastol
- et al.
- 1990
- IBM J. Res. Dev
Publications
Date
Featured collections
Popular topics
745 results at IBM J. Res. Dev
Surface and interfacial energies of CoSi2 and Si films. Implications regarding formation of three-dimensional silicon-silicide structures
- K.N. Tu
- 1990
- IBM J. Res. Dev
Diamondlike carbon films by rf plasma-assisted chemical vapor deposition from acetylene
- A. Grill
- B.S. Meyerson
- et al.
- 1990
- IBM J. Res. Dev
Cellular automata circuits for built-in self-test
- P.D. Hortensius
- R.D. McLeod
- et al.
- 1990
- IBM J. Res. Dev
Surface chemistry of the WF6-based chemical vapor deposition of tungsten
- M.L. Yu
- K.Y. Ahn
- et al.
- 1990
- IBM J. Res. Dev
Internal probing of submicron FETs and photoemission using individual oxide traps
- P. Restle
- Antonio Gnudi
- 1990
- IBM J. Res. Dev
Low-temperature Si and Si:Ge epitaxy by ultrahigh-vacuum/chemical vapor deposition. Process fundamentals
- B.S. Meyerson
- 1990
- IBM J. Res. Dev
Picosecond noninvasive optical detection of internal electrical signals in flip-chip-mounted silicon integrated circuits
- H. Heinrich
- 1990
- IBM J. Res. Dev
Picosecond photoemission probing of integrated circuits. Capabilities, limitations, and applications
- R. Clauberg
- H. Beha
- et al.
- 1990
- IBM J. Res. Dev
Lanthanide gallate perovskite-type substrates for epitaxial, high-Tc superconducting Ba2YCu3O7-δ films
- E.A. Giess
- R.L. Sandstrom
- et al.
- 1990
- IBM J. Res. Dev