Electromigration in 0.25 μm wide Cu line on W
- C.-K. Hu
- K.Y. Lee
- et al.
- 1997
- Thin Solid Films
Paper
Publications
310 results at Thin Solid Films
Electromigration failures in line-stud structures as a function of line length
- M.B. Small
- C.-K. Hu
- 1997
- Thin Solid Films
PaperScanning force microscopy of polyimide surfaces
- Christos D. Dimitrakopoulos
- Steven P. Kowalczyk
- 1997
- Thin Solid Films
PaperLow-field magnetoresistance in Si/SiGe quantum wells
- A. Prinz
- G. Brunthaler
- et al.
- 1997
- Thin Solid Films
PaperTantalum plasma etching with minimum effect on underlying nickel-iron thin film
- R. Hsiao
- D.C. Miller
- et al.
- 1997
- Thin Solid Films
PaperElectron beam induced damage in N-rich SiNx films deposited by plasma enhanced chemical vapour deposition
- Ch.B. Lioutas
- N. Vouroutzis
- et al.
- 1997
- Thin Solid Films
PaperFormation of a crystalline metal-rich suicide in thin film titanium/silicon reactions
- L. Clevenger
- C. Cabral Jr.
- et al.
- 1996
- Thin Solid Films
PaperEpitaxial growth of metals by sputter deposition
- G.R. Harp
- S.S.P. Parkin
- 1996
- Thin Solid Films
PaperStructure and permeation in gegenion complex Langmuir-Blodgett films
- Paul J. Bruinsma
- Pieter Stroeve
- et al.
- 1996
- Thin Solid Films
PaperGas transfer in supported films made by molecular self-assembly of ionic polymers
- Pieter Stroeve
- Victor Vasquez
- et al.
- 1996
- Thin Solid Films
Paper