Publications

465 results at IEEE T-ED

Transistor Matching and Fin Angle Variation in FinFET Technology
- - Samarth Agarwal
  - Terence B. Hook
  - et al.
- 2015
- IEEE T-ED
Random dopant fluctuation induced variability in undoped channel si gate all around nanowire n-MOSFET
- - Kaushik Nayak
  - Samarth Agarwal
  - et al.
- 2015
- IEEE T-ED
On the origin of steep i - V nonlinearity in mixed-ionic-electronic-conduction-based access devices
- - Alvaro Padilla
  - Geoffrey W. Burr
  - et al.
- 2015
- IEEE T-ED
Frequency-modulated charge pumping with extremely high gate leakage
- - Jason T. Ryan
  - Jibin Zou
  - et al.
- 2015
- IEEE T-ED
Series stacked multipath inductor with high self resonant frequency
- - Venkata Nr Vanukuru
  - Anjan Chakravorty
- 2015
- IEEE T-ED
Metal-gate granularity-induced threshold voltage variability and mismatch in Si gate-all-around nanowire n-MOSFETs
- - Kaushik Nayak
  - Samarth Agarwal
  - et al.
- 2014
- IEEE T-ED
A four-FET method for extracting mobility in FETs without field oxide
- - Amlan Majumdar
  - Ko-Tao Lee
  - et al.
- 2014
- IEEE T-ED
Design of novel high-Q multipath parallel-stacked inductor
- - Venkata Narayana Rao Vanukuru
  - Anjan Chakravorty
- 2014
- IEEE T-ED
CMOS-Compatible self-aligned In_0.53Ga_0.47As MOSFETs with gate lengths down to 30 nm
- - Amlan Majumdar
  - Yanning Sun
  - et al.
- 2014
- IEEE T-ED
Experimental study of gate-first finfet threshold-voltage mismatch
- - Qintao Zhang
  - Cindy Wang
  - et al.
- 2014
- IEEE T-ED