Characterization of nitrogen-containing glasses by x-ray photoelectron spectroscopyG.H. FrischatR. Fern1986JVSTAPaper
Properties of reactively sputtered tungsten films in nitrogen and oxygenK.Y. AhnS.B. Brodskvet al.1986JVSTAPaper
Effect of the sintering process on the formation and passivation of PtSiH.-C.W. HuangF.E. Tureneet al.1986JVSTAPaper
Low temperature material reaction at the Ti/Si(111) interfaceR.M. TrompG.W. Rubloffet al.1986JVSTAPaper
Summary Abstract: Non-bulk-like physical properties of thin films due to ion bombardment during film growthEric Kay1986JVSTAPaper
Synchrotron-radiation excited carbon is photoemission study of Cr/organic polymer interfacesJ.L. JordanP.N. Sandaet al.1986JVSTAPaper
Summary Abstract: Electron vibrational spectroscopy of polymer-vacuum and polvmer-metal interfacesJ.E. DemuthT.C. Clark1986JVSTAPaper