Hf O2 high-k dielectrics grown on (100)Ge with ultrathin passivation layers: Structure and interfacial stability
- J.W. Seo
- Ch. Dieker
- et al.
- 2005
- Applied Physics Letters
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Sub-bandgap defect states in polycrystalline hafnium oxide and their suppression by admixture of silicon
- N.V. Nguyen
- Albert V. Davydov
- et al.
- 2005
- Applied Physics Letters
Experimental observation of attractive and repulsive thermal forces on microcantilevers
- B. Gotsmann
- U. Dürig
- 2005
- Applied Physics Letters
Growth and magnetism of Cr-doped InN
- R. Rajaram
- A. Ney
- et al.
- 2005
- Applied Physics Letters
Self-aligned self assembly of multi-nanowire silicon field effect transistors
- C.T. Black
- 2005
- Applied Physics Letters
Aluminum mobility and interfacial segregation in fully silicided gate contacts
- R.P. Pezzi
- M. Copel
- et al.
- 2005
- Applied Physics Letters
Enhanced feedback in organic photonic-crystal lasers
- Rik Harbers
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- et al.
- 2005
- Applied Physics Letters
Controlled nucleation of dislocations by a spatially localized stress field
- M. Kammler
- D. Chidambarrao
- et al.
- 2005
- Applied Physics Letters
Formation of nanopores in a SiN/SiO 2 membrane with an electron beam
- Meng-Yue Wu
- Diego Krapf
- et al.
- 2005
- Applied Physics Letters
Oxygen defects and Fermi level location in metal-hafnium oxide-silicon structures
- Daeyoung Lim
- Richard Haight
- et al.
- 2005
- Applied Physics Letters