Low-energy electron microscopy
- Rudolf M. Tromp
- 2000
- IBM J. Res. Dev
Publications
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745 results at IBM J. Res. Dev
Reduction of electromigration in aluminum films by copper doping
- Irving Ames
- Francois M. D'Heurle
- et al.
- 2000
- IBM J. Res. Dev
Controlled collapse reflow chip joining
- Lewis F. Miller
- 2000
- IBM J. Res. Dev
Future of CMOS technology
- Randall D. Isaac
- 2000
- IBM J. Res. Dev
Picosecond imaging circuit analysis
- James C. Tsang
- Jeffrey A. Kash
- et al.
- 2000
- IBM J. Res. Dev
Minimal-storage high-performance Cholesky factorization via blocking and recursion
- Fred G. Gustavson
- Isak Jonsson
- 2000
- IBM J. Res. Dev
Random-Access Memory Accounting Machine. I. System organization of the IBM 305
- Murray L. Lesser
- John W. Haanstra
- 2000
- IBM J. Res. Dev
Scanning tunneling microscopy
- G. Binnig
- H. Rohrer
- 2000
- IBM J. Res. Dev
Applying recursion to serial and parallel QR factorization leads to better performance
- E. Elmroth
- F.G. Gustavson
- 2000
- IBM J. Res. Dev
Modeling and characterization of quantization, polysilicon depletion, and direct tunneling effects in MOSFETs with ultrathin oxides
- S.H. Lo
- D.A. Buchanan
- et al.
- 1999
- IBM J. Res. Dev