Effect of the environment on the measured values of the adhesion of polyimide to silicon
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- 1999
- Journal of Adhesion Science and Technology
Paper
Publications
14468 results for Physical Sciences
Electrostatic discharge (ESD) protection in silicon-on-insulator (SOI) CMOS technology with aluminum and copper interconnects in advanced microprocessor semiconductor chips
- S. Voldman
- D. Hui
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- 1999
- EOS/ESD 1999
Conference paperSub-60 nm physical gate length SOI CMOS
- I.Y. Yang
- K. Chen
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- 1999
- IEDM 1999
Conference paperVery high performance 50 nm CMOS at low temperature
- S.J. Wind
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- 1999
- IEDM 1999
Conference paperEffect of inert gas additive on Cl2-based inductively coupled plasma etching of NiFe and NiFeCo
- K.B. Jung
- H. Cho
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- 1999
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Conference paperPetroSPIRE: A multi-modal content-based retrieval system for petroleum applications
- L. Bergman
- V. Castelli
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- 1999
- Photonics East 1999
Conference paper12.1 inches SVGA wide viewing angle TFT-LCDS based on ridge and fringe-field structures
- Alan Lien
- C. Cai
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- 1999
- MRS Spring Meeting 1999
Conference paperFrame architecture for videoservers
- C. Venkatramani
- Martin G. Kienzle
- 1999
- Photonics East 1999
Conference paperIssues in modeling small devices
- S.E. Laux
- M.V. Fischetti
- 1999
- IEDM 1999
Conference paperEfficient multidimensional indexing structure for linear maximization queries
- Y.-C. Chang
- L. Bergman
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- 1999
- Photonics East 1999
Conference paper