Conduction bandstructure in strained silicon by spatially resolved electron energy loss spectroscopyP.E. Batson1995Ultramicroscopy
Near-field, far-field and imaging properties of the 2D aperture SNOML. NovotnyD. Pohlet al.1995Ultramicroscopy
Light confinement in scanning near-field optical microscopyLukas NovotnyDieter W. Pohlet al.1995Ultramicroscopy
Piezoresistive cantilevers as optical sensors for scanning near-field microscopyP. BauerB. Hechtet al.1995Ultramicroscopy
Electron microscopy of the grain structure of metal films and linesDavid A. SmithMartin Smallet al.1993Ultramicroscopy