Rapid imaging of misfit dislocations in SiGe/Si in cross-section and through oxide layers using electron channeling contrast
- Kunal Mukherjee
- Brent A. Wacaser
- et al.
- 2017
- Applied Physics Letters
Paper
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2351 results at Applied Physics Letters
High-precision deformation mapping in finFET transistors with two nanometre spatial resolution by precession electron diffraction
- David Cooper
- N. Bernier
- et al.
- 2017
- Applied Physics Letters
PaperSFG analysis of the molecular structures at the surfaces and buried interfaces of PECVD ultralow-dielectric constant pSiCOH: Reactive ion etching and dielectric recovery
- John N. Myers
- Xiaoxian Zhang
- et al.
- 2017
- Applied Physics Letters
PaperBias dependence of spin transfer torque in Co2MnSi Heusler alloy based magnetic tunnel junctions
- Jie Zhang
- Timothy Phung
- et al.
- 2017
- Applied Physics Letters
PaperTime-multiplexed amplification in a hybrid-less and coil-less Josephson parametric converter
- Baleegh Abdo
- Jose Chavez-Garcia
- et al.
- 2017
- Applied Physics Letters
PaperBallistic one-dimensional transport in InAs nanowires monolithically integrated on silicon
- Johannes Gooth
- Vanessa Schaller
- et al.
- 2017
- Applied Physics Letters
PaperCircuit quantum electrodynamics architecture for gate-defined quantum dots in silicon
- X. Mi
- J.V. Cady
- et al.
- 2017
- Applied Physics Letters
PaperHigh-response piezoelectricity modeled quantitatively near a phase boundary
- Dennis M. Newns
- Marcelo A. Kuroda
- et al.
- 2017
- Applied Physics Letters
PaperTailoring capping layers to reduce stress gradients in copper metallization
- Conal E. Murray
- Deepika Priyadarshini
- et al.
- 2016
- Applied Physics Letters
PaperDetermining the vibrations between sensor and sample in SQUID microscopy
- Daniel Schiessl
- John R. Kirtley
- et al.
- 2016
- Applied Physics Letters
Paper