Highly pure single photon emission from spectrally uniform surface-curvature directed mesa top single quantum dot ordered array
- Jiefei Zhang
- Swarnabha Chattaraj
- et al.
- 2019
- Applied Physics Letters
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2344 results at Applied Physics Letters
Ambipolar quantum dots in undoped silicon fin field-effect transistors
- Andreas V. Kuhlmann
- Veeresh Deshpande
- et al.
- 2018
- Applied Physics Letters
Effect of hot carrier stress on device junctions measured by electron holography and scanning capacitance microscopy
- Yun-Yu Wang
- J. Nxumalo
- et al.
- 2018
- Applied Physics Letters
Electron scattering at interfaces in nano-scale vertical interconnects: A combined experimental and ab initio study
- Nicholas A. Lanzillo
- Oscar D. Restrepo
- et al.
- 2018
- Applied Physics Letters
Strain, stress, and mechanical relaxation in fin-patterned Si/SiGe multilayers for sub-7 nm nanosheet gate-all-around device technology
- S. Reboh
- R. Coquand
- et al.
- 2018
- Applied Physics Letters
Bio-inspired silicon nanospikes fabricated by metal-assisted chemical etching for antibacterial surfaces
- Huan Hu
- Vince Siu
- et al.
- 2017
- Applied Physics Letters
Bulk-impurity induced noise in large-area epitaxial thin films of topological insulators
- Saurav Islam
- Semonti Bhattacharyya
- et al.
- 2017
- Applied Physics Letters
Rapid imaging of misfit dislocations in SiGe/Si in cross-section and through oxide layers using electron channeling contrast
- Kunal Mukherjee
- Brent A. Wacaser
- et al.
- 2017
- Applied Physics Letters
High-precision deformation mapping in finFET transistors with two nanometre spatial resolution by precession electron diffraction
- David Cooper
- N. Bernier
- et al.
- 2017
- Applied Physics Letters
SFG analysis of the molecular structures at the surfaces and buried interfaces of PECVD ultralow-dielectric constant pSiCOH: Reactive ion etching and dielectric recovery
- John N. Myers
- Xiaoxian Zhang
- et al.
- 2017
- Applied Physics Letters