Manufacturability versus reliability issues relevant to interconnect metallizations
- K.P. Rodbell
- E.G. Colgan
- et al.
- 1994
- MRS Spring Meeting 1994
Publications
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14207 results for Physical Sciences
HCP-FCC phase transition in Co-Ni alloys studied with magneto-optical Kerr spectroscopy
- A. Carl
- D. Weller
- et al.
- 1994
- MRS Spring Meeting 1994
SOI for a 1-Volt CMOS Technology and Application to a 512kb SRAM with 3.5 ns Access Time
- G. Shahidi
- T.H. Ning
- et al.
- 1993
- IEDM 1993
High performance dielectrics and processes for ULSI interconnection technologies
- J. Paraszczak
- D. Edelstein
- et al.
- 1993
- IEDM 1993
Three-Dimensional “Atomistic” Simulation of Discrete Random Dopant Distribution Effects in Sub-0.1μm MOSFET's
- Hon-Sum Wong
- Yuan Taur
- 1993
- IEDM 1993
INVESTIGATION OF HOT ELECTRON LUMINESCENCE IN SILICON BY MEANS OF DUAL-GATE MOSFET's
- Luca Selmi
- Hon-Sum Wong
- et al.
- 1993
- IEDM 1993
A 0.6 µm2 256Mb Trench DRAM Cell with Self-Aligned Buried Strap (BEST)
- L.A. Nesbit
- J. Alsmeier
- et al.
- 1993
- IEDM 1993
Submicron CMOS Gate Electrode Discontinuity: Electrical Signature and Effect on Circuit Speed
- Keith A. Jenkins
- J.N. Burghartz
- et al.
- 1993
- IEDM 1993
Optimization of SiGe HBT Technology for High Speed Analog and Mixed-Signal Applications
- D.L. Harame
- J.M.C. Stork
- et al.
- 1993
- IEDM 1993
MODELING ON INCREASE OF N-P-N AND P-N-P CURRENT GAIN BY HYDROGEN ELECTROMIGRATION IN POLYSILICON EMITTERS
- J. Zhao
- G.P. Li
- et al.
- 1993
- IEDM 1993