Product-representative "at speed" test structures for CMOS characterization
- Mark B. Ketchen
- Manjul Bhushan
- 2006
- IBM J. Res. Dev
Publications
Date
Featured collections
Popular topics
745 results at IBM J. Res. Dev
Optimizing CMOS technology for maximum performance
- David J. Frank
- Wilfried Haensch
- et al.
- 2006
- IBM J. Res. Dev
High-performance CMOS variability in the 65-nm regime and beyond
- Kerry Bernstein
- David J. Frank
- et al.
- 2006
- IBM J. Res. Dev
Germanium channel MOSFETs: Opportunities and challenges
- Huiling Shang
- Martin M. Frank
- et al.
- 2006
- IBM J. Res. Dev
Development of the magnetic tunnel junction MRAM at IBM: From first junctions to a 16-Mb MRAM demonstrator chip
- William J. Gallagher
- Stuart S.P. Parkin
- 2006
- IBM J. Res. Dev
Rapid-turnaround characterization methods for MRAM development
- David W. Abraham
- Philip L. Trouilloud
- et al.
- 2006
- IBM J. Res. Dev
Limited switch dynamic logic circuits for high-speed low-power circuit design
- Wendy Belluomini
- Damir Jamsek
- et al.
- 2006
- IBM J. Res. Dev
Reliability of modular mesh-connected intelligent storage brick systems
- Claudio Fleiner
- Robert B. Garner
- et al.
- 2006
- IBM J. Res. Dev
Braids and fibers: Language constructs with architectural support for adaptive responses to memory latencies
- David F. Bacon
- Xiaowei Shen
- 2006
- IBM J. Res. Dev
Two-level BEOL processing for rapid iteration in MRAM development
- Michael C. Gaidis
- Eugene J. O'Sullivan
- et al.
- 2006
- IBM J. Res. Dev