Repassivation Transients Measured with the Breaking-Electrode Technique on Aluminum Thin-Film Samples
- C.V. Jahnes
- V. Brusic
- et al.
- 1995
- JES
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Low Temperature Atmospheric Pressure Chemical Vapor Deposition for Epitaxial Growth of SiGe Bipolar Transistors
- D.A. Grutzmacher
- D.A. Grutzmacher
- 1995
- JES
Alloying of a Less Noble Metal in Electrodeposited Cu Through Underpotential Deposition
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- 1995
- JES
Composition Determination of NiCo Alloys by the RRDE Method
- P.C. Andricacos
- 1995
- JES
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- 1995
- JES
Plasma Etching and Deposition for a-Si: H Thin Film Transistors
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- JES
Screening of charged electrodes in aqueous electrolytes
- James N. Glosli
- 1995
- JES
Thin Film Transistors with Graded SiNx Gate Dielectrics
- Yue Kuo
- 1994
- JES
Intrinsic and Passivation-Induced Trench Tapering during Plasma Etching
- S. Hamaguchi
- M. Dalvie
- 1994
- JES
Electrochemically Deposited Diffusion Barriers
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- Robert G. Schad
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- JES