A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design
- R.M. Tromp
- James B. Hannon
- et al.
- 2010
- Ultramicroscopy
Paper
Publications
128 results at Ultramicroscopy
Medipix 2 detector applied to low energy electron microscopy
- R. van Gastel
- I. Sikharulidze
- et al.
- 2009
- Ultramicroscopy
PaperCharacterizing probe performance in the aberration corrected STEM
- P.E. Batson
- 2006
- Ultramicroscopy
PaperArtifacts in aberration-corrected ADF-STEM imaging
- Zhiheng Yu
- Philip E. Batson
- et al.
- 2003
- Ultramicroscopy
Conference paperAberration correction results in the IBM STEM instrument
- P.E. Batson
- 2003
- Ultramicroscopy
Conference paperA cantilever array-based artificial nose
- M.K. Baller
- H.P. Lang
- et al.
- 2000
- Ultramicroscopy
PaperAdvanced spatially resolved EELS in the STEM
- P.E. Batson
- 1999
- Ultramicroscopy
Conference paperTowards quantitative electron holography of magnetic thin films using in situ magnetization reversal
- R.E. Dunin-Borkowski
- M.R. McCartney
- et al.
- 1998
- Ultramicroscopy
PaperImplications of high resolution to near-field optical microscopy
- Lukas Novotny
- Bert Hecht
- et al.
- 1998
- Ultramicroscopy
PaperGreatly defocused, point-projection, off-axis electron holography
- J.M. Cowley
- M. Mankos
- et al.
- 1996
- Ultramicroscopy
Paper