Microporous crosslinked elastomers
- J.L. Hedrick
- S.A. Srinivasan
- et al.
- 1996
- MRS Spring Meeting 1996
Publications
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14204 results for Physical Sciences
Phase formation in Cu(Sn) alloy thin films
- L. Clevenger
- B. Arcot
- et al.
- 1996
- MRS Spring Meeting 1996
Electromigration and diffusion in pure Cu and Cu(Sn) alloys
- C.-K. Hu
- K.L. Lee
- et al.
- 1996
- MRS Spring Meeting 1996
Electromigration and diffusion in pure Cu and Cu(Sn) alloys
- C.-K. Hu
- K.L. Lee
- et al.
- 1996
- MRS Spring Meeting 1996
Residual stress and lattice distortion mapping of patterned devices which failed electromigration testing using the microbeam X-ray diffraction (MXRD) technique
- B.R. York
- H.L. Pfizenmayer
- et al.
- 1996
- MRS Spring Meeting 1996
Dependence of crystallographic texture of C54 TiSi2 on thickness and linewidth in submicron CMOS structures
- V. Svilan
- K.P. Rodbell
- et al.
- 1996
- MRS Spring Meeting 1996
Copper migration and precipitate dissolution in aluminum/copper lines during electromigration testing
- T.M. Shaw
- C.-K. Hu
- et al.
- 1996
- MRS Spring Meeting 1996
Scalable low power vertical memory
- H.I. Hanafi
- S. Tiwari
- et al.
- 1995
- IEDM 1995
Monte Carlo study of sub-band-gap impact ionization in small silicon field-effect transistors
- M.V. Fischetti
- S.E. Laux
- 1995
- IEDM 1995
High-Q inductors in standard silicon interconnect technology and its application to an integrated RF power amplifier
- J.N. Burghartz
- M. Soyuer
- et al.
- 1995
- IEDM 1995