Measurement and analysis of source/drain contact resistance in FinFETs
- Abhisek Dixit
- Nadine Collaert
- et al.
- 2011
- IWPSD 2011
Publications
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3508 results for Mathematical Sciences
Using well/substrate bias manipulation to enhance voltage-test-based defect detection
- Anne Gattiker
- Phil Nigh
- 2011
- IEEE ITC 2011
The trade-offs between thin and thick absorbers for EUV photomasks
- Gregory McIntyre
- Christian Zuniga
- et al.
- 2011
- SPIE Photomask Technology + EUV Lithography 2011
Total Source Mask Optimization: High-capacity, resist modeling, and production-ready mask solution
- Moutaz Fakhry
- Yuri Granik
- et al.
- 2011
- SPIE Photomask Technology + EUV Lithography 2011
Using custom features to check OPC model performance
- Amr Abdo
- Ramya Viswanathan
- 2011
- SPIE Photomask Technology + EUV Lithography 2011
Use of Gray codes for optimizing the search of (shortened) cyclic single burst-correcting codes
- Luis Javier García Villalba
- José René Fuentes Cortez
- et al.
- 2011
- ISIT 2011
ServiceMap: Providing map and GPS assistance to service composition in bioinformatics
- Wei Tan
- Jia Zhang
- et al.
- 2011
- SCC 2011
Managing enterprise IT systems using online communities
- Maja Vukovic
- Vijay K. Naik
- 2011
- SCC 2011
Data augmentation as a service for single view creation
- Ullas Nambiar
- Tanveer A. Faruquie
- et al.
- 2011
- SCC 2011
Migration to multi-image cloud templates
- Birgit Pfitzmann
- Nikolai Joukov
- 2011
- SCC 2011