CMOS TECHNOLOGY SCALING, O.lpm AND BEYOND
- Bijan Davari
- 1996
- IEDM 1996
Publications
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14204 results for Physical Sciences
A High-Density 6.9 sq. pm Embedded SRAM Cell in a High-Performance 0.25 μm-Generation CMOS Logic Technology
- S. Subbanna
- P. Agnello
- et al.
- 1996
- IEDM 1996
Diamondlike carbon materials as low-k dielectrics for multilevel interconnects in ULSI
- A. Grill
- V.V. Patel
- et al.
- 1996
- MRS Fall Meeting 1996
In-situ X-ray diffraction analysis of TiSi2 phase formation from a titanium-molybdenum bilayer
- C. Cabral Jr.
- L. Clevenger
- et al.
- 1996
- MRS Fall Meeting 1996
Electrochemical modification of La2CuO4: The role played by microstructure
- E.J. Williams
- A. Daridon
- et al.
- 1996
- MRS Fall Meeting 1996
Chloroethane physisorbed on hydrogenated Si(111): A test system for the evaluation of core level XPS assignment rules at Si/SiO2 interfaces
- F.R. McFeely
- K.Z. Zhang
- et al.
- 1996
- MRS Fall Meeting 1996
Depth-sensitive strain analysis of a W/Ta/W trilayer
- S. Malhotra
- Z. Rek
- et al.
- 1996
- MRS Fall Meeting 1996
Cracking a tough NUT* with a big computer
- F.F. Abraham
- D. Schneider
- et al.
- 1996
- MRS Fall Meeting 1996
Electrodeposition for Hi-MEMS with special reference to fabrication of a magnetic mini-motor
- E.J.M. O'Sullivan
- E.I. Cooper
- et al.
- 1996
- MRS Fall Meeting 1996
In situ TEM analysis of TiSi2 C49-C54 transformations during annealing
- L. Gignac
- V. Svilan
- et al.
- 1996
- MRS Fall Meeting 1996