Electron-Beam Resist Edge Profile Simulation
- David F. Kyser
- Chiu H. Ting
- 1979
- IEEE T-ED
Paper
Publications
465 results at IEEE T-ED
VLSI Limitations from Drain-Induced Barrier Lowering
- Ronald R. Troutman
- 1979
- IEEE T-ED
PaperSimple Analytical Models for the Temperature Dependent Threshold Behavior of Depletion-Mode Devices
- Fritz H. Gaensslen
- 1979
- IEEE T-ED
Paper1 μm MOSFET VLSI Technology: Part VI—Electron-Beam Lithography
- Warren D. Grobman
- Hans E. Luhn
- et al.
- 1979
- IEEE T-ED
Paper1 μm MOSFET VLSI Technology: Part Ill—Logic Circuit Design Methodology and Applications
- Peter W. Cook
- Stanley E. Schuster
- et al.
- 1979
- IEEE T-ED
PaperThe Evolution of Digital Electronics Towards VLSI
- Robert W. Keyes
- 1979
- IEEE T-ED
Paper1 µm MOSFET VLSI Technology: Part 1-An Overview
- Hwa-Nien Yu
- Arnold Reisman
- et al.
- 1979
- IEEE T-ED
Paper1 μm MOSFET VLSI Technology: Part IV—Hot-Electron Design Constraints
- Tak H. Ning
- Peter W. Cook
- et al.
- 1979
- IEEE T-ED
PaperOne-Device Cells for Dynamic Random-Access Memories: A Tutorial
- V. Leo Rideout
- 1979
- IEEE T-ED
PaperThe V-Groove Multijunction Solar Cell
- Terry I. Chappell
- 1979
- IEEE T-ED
Paper