High conductivity gate metallurgy for TFT/LCD's
- P.M. Fryer
- E.G. Colgan
- et al.
- 1998
- MRS Spring Meeting 1998
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14204 results for Physical Sciences
Electrical test sites for AMLCD-TFT array process characterization
- E.G. Colgan
- R.J. Polastre
- et al.
- 1998
- MRS Spring Meeting 1998
Templating nanoporosity in organosilicates using well-defined branched macromolecules
- J.L. Hedrick
- C.J. Hawker
- et al.
- 1998
- MRS Spring Meeting 1998
Reliability and copper interconnections with low dielectric constant materials
- C.-K. Hu
- 1998
- MRS Spring Meeting 1998
Properties development during curing of low dielectric-constant spin-on glasses
- R.F. Cook
- E. Liniger
- et al.
- 1998
- MRS Spring Meeting 1998
Mechanisms for microstructure evolution in electroplated copper thin films
- J.M.E. Harper
- C. Cabral Jr.
- et al.
- 1999
- MRS Spring Meeting 1999
Characterization of plated Cu thin film microstructures
- L. Gignac
- K.P. Rodbell
- et al.
- 1999
- MRS Spring Meeting 1999
Hole mobility improvement in silicon-on-insulator and bulk silicon transistors using local strain
- S. Tiwari
- M.V. Fischetti
- et al.
- 1997
- IEDM 1997
7.9/5.5 psec room/low temperature SOI CMOS
- F. Assaderaghi
- W. Rausch
- et al.
- 1997
- IEDM 1997
Full copper wiring in a sub-0.25 μm CMOS ULSI technology
- D. Edelstein
- J. Heidenreich
- et al.
- 1997
- IEDM 1997