Application of Line-Edge Profile Simulation to Thin-Film Deposition Processes
- Andrew R. Neureuther
- Chiu H. Ting
- et al.
- 1980
- IEEE T-ED
Publications
465 results at IEEE T-ED
Simulation of Impurity Freezeout Through Numerical Solution of Poisson's Equation with Application to MOS Device Behavior
- Richard C. Jaeger
- Fritz H. Gaensslen
- 1980
- IEEE T-ED
A Study of the Conversion Efficiency Limit of p+-i-n+ Silicon Solar Cells in Concentrated Sunlight
- Terry I. Chappell
- 1980
- IEEE T-ED
TA-A2 Electrically Alterable Read-only Memory Using Si Rich SiO2 Injectors and a Floating Polycrystalline Silicon Storage Layer
- D.J. DiMaria
- K.M. DeMeyer
- et al.
- 1980
- IEEE T-ED
TP-A1 Fabrication and Properties of Ultrasmall Superconducting Structures
- Robert B. Laibowitz
- Richard F. Voss
- et al.
- 1980
- IEEE T-ED
TP-A6 The Behavior of Schottky Barriers to GaAs as a function of Annealing Temperature
- H.J. Hovel
- C. Lanza
- 1980
- IEEE T-ED
Niobium Oxide-Barrier Tunnel Junction
- Stanley I. Raider
- Robert E. Drake
- et al.
- 1980
- IEEE T-ED
Effect of Emitter Contact on Current Gain of Silicon Bipolar Devices
- Tak H. Ning
- Randall D. Isaac
- 1980
- IEEE T-ED
1 μm MOSFET VLSI Technology: Part Ill—Logic Circuit Design Methodology and Applications
- Peter W. Cook
- Stanley E. Schuster
- et al.
- 1979
- IEEE T-ED
1 µm MOSFET VLSI Technology: Part 1-An Overview
- Hwa-Nien Yu
- Arnold Reisman
- et al.
- 1979
- IEEE T-ED