Simulation of Impurity Freezeout Through Numerical Solution of Poisson's Equation with Application to MOS Device Behavior
- Richard C. Jaeger
- Fritz H. Gaensslen
- 1980
- IEEE T-ED
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A Study of the Conversion Efficiency Limit of p+-i-n+ Silicon Solar Cells in Concentrated Sunlight
- Terry I. Chappell
- 1980
- IEEE T-ED
Niobium Oxide-Barrier Tunnel Junction
- Stanley I. Raider
- Robert E. Drake
- et al.
- 1980
- IEEE T-ED
Heavy Doping Effects in p-n-p Bipolar Transistors
- D.D. Tang
- 1980
- IEEE T-ED
A Device Model for Buried-Channel CCD's and MOSFET's with Gaussian Impurity Profiles
- Pallab K. Chatterjee
- Geoffrey W. Taylor
- et al.
- 1980
- IEEE T-ED
TP-A3 Capless Annealing of GaAs Using a Controlled Excess as Vapor Pressure Source
- H. Rupprecht
- J. Woodall
- 1980
- IEEE T-ED
High-Reliability Pb-Alloy Josephson Junctions for Integrated Circuits
- H.-C. Ward Huang
- Suryadevar Basavaiah
- et al.
- 1980
- IEEE T-ED
Memory-Cell Design in Josephson Technology
- Hans H. Zappe
- 1980
- IEEE T-ED
Fabrication of an Integrated, Planar Silicon Ink-Jet Structure
- Kurt E. Petersen
- 1979
- IEEE T-ED
Modeling Diffusion and Collection of Charge from Ionizing Radiation in Silicon Devices
- Scott Kirkpatrick
- 1979
- IEEE T-ED