Electronic structure of silicide-silicon interfaces
- G.W. Rubloff
- P.S. Ho
- 1982
- Thin Solid Films
Paper
Publications
3555 results for Materials Discovery
Formation and structure of epitaxial NiSi2 and CoSi2
- L.J. Chen
- J.W. Mayer
- et al.
- 1982
- Thin Solid Films
PaperAn X-ray study of domain structure and stress in Pd2Si films at Pd-Si interfaces
- Haydn Chen
- G.E. White
- et al.
- 1982
- Thin Solid Films
PaperLattice imaging of silicide-silicon interfaces
- L.J. Chen
- J.W. Mayer
- et al.
- 1982
- Thin Solid Films
PaperAnalysis of high resolution electron microscope images of the Pd2Si-Si interface
- W. Krakow
- 1982
- Thin Solid Films
PaperAdsorption and decomposition of ammonia on a W(110) surface: Photoemission fingerprinting and interpretation of the core level binding energies using the equivalent core approximation
- M. Grunze
- C.R. Brundle
- et al.
- 1982
- Surface Science
PaperEffects of beam, target and substrate potentials in ion beam processing
- J.M.E. Harper
- 1982
- Thin Solid Films
PaperHelium diffraction from MgO(100)
- K.H. Rieder
- 1982
- Surface Science
PaperPreparation of Pb-Bi film by alloy evaporation I: Film composition control
- H.-C.W. Huang
- B.L. Gilbert
- 1982
- Thin Solid Films
PaperExperimental investigation of the energy dependence and evidence for the softness of the He/Ni(110) potential
- K.H. Rieder
- 1982
- Surface Science
Paper