Motion of W marker during sequential compound formation in bimetallic AlCu thin films
- H.T.G. Hentzell
- R.D. Thompson
- et al.
- 1983
- Materials Letters
Paper
Publications
3555 results for Materials Discovery
Preparation of Pb-Bi film by alloy evaporation II. Microstructure and morphology
- H.-C.W. Huang
- C.M. Serrano
- 1983
- JVSTA
PaperChemical bonding and reactions at Ti/Si and Ti/oxygen/Si interfaces
- R. Blitz
- G.W. Rubloff
- et al.
- 1983
- JVSTA
PaperPhase diagram of the (LaAlO3)1-x (SrTiO3)x solid-solution system, for x ≤ 0.8
- J.G. Bednorz
- K.A. Müller
- et al.
- 1983
- Materials Research Bulletin
PaperOxygen chemisorption and oxide formation on Si(111) and Si(100) surfaces
- G. Hollinger
- F.J. Himpsel
- 1983
- JVSTA
PaperA He-diffraction investigation of the p(2×2) and c(2×2) phases of oxygen on Ni(100)
- K.H. Rieder
- 1983
- Surface Science
PaperChemical bonding and Schottky barrier formation at transition metal-silicon interfaces
- Paul S. Ho
- 1983
- JVSTA
PaperEffect of surface chemistry and work function in secondary ion mass spectrometry
- Ming L. Yu
- 1983
- JVSTA
PaperCorrelation between the ion bombardment during film growth of Pd films and their structural and electrical properties
- P. Ziemann
- E. Kay
- 1983
- JVSTA
PaperAmmonia cluster formation and NH3 decomposition on a Ni(100) surface
- M. Grunze
- P.A. Dowben
- et al.
- 1983
- Surface Science
Paper