Thermal instability of the Cu-Ni interface above 200°C
- T.H. Westmore
- J.E.E. Baglin
- et al.
- 1998
- MRS Spring Meeting 1998
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14204 results for Physical Sciences
Applicability of Sneddon relationships to the real case of a rigid cone penetrating an infinite half space
- J.C. Hay
- A. Bolshakov
- et al.
- 1998
- MRS Spring Meeting 1998
Progress in RF inductors on silicon - understanding substrate losses
- J.N. Burghartz
- 1998
- IEDM 1998
25 nm CMOS design considerations
- Y. Taur
- C. Wann
- et al.
- 1998
- IEDM 1998
Reliability projection for ultra-thin oxides at low voltage
- J.H. Stathis
- D.J. DiMaria
- 1998
- IEDM 1998
Device design considerations for double-gate, ground-plane, and single-gated ultra-thin SOI MOSFET's at the 25 nm channel length generation
- H.-S. Wong
- David J. Franks
- et al.
- 1998
- IEDM 1998
Within-chip variability analysis
- S. Nassif
- 1998
- IEDM 1998
Stability and oxidation behavior of Ir thin film electrodes on Si and SiO2
- K.L. Saenger
- A. Grill
- et al.
- 1998
- MRS Fall Meeting 1998
High conductivity gate metallurgy for TFT/LCD's
- P.M. Fryer
- E.G. Colgan
- et al.
- 1998
- MRS Spring Meeting 1998
Deposition of highly conductive n+ silicon film for a-Si:H thin film transistor
- Y. Kuo
- K. Latzko
- 1998
- MRS Spring Meeting 1998