Reactive lon Etching for VLSI
- Linda M. Ephrath
- 1981
- IEEE T-ED
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465 results at IEEE T-ED
IVA-6 Characteristics of AuGeNi Ohmic Contacts to GaAs
- M. Heiblum
- M.I. Nathan
- et al.
- 1981
- IEEE T-ED
Deep UV Photoresists I. Meldrum's Diazo Sensitizer
- Barbara D. Grant
- Nicholas J. Clecak
- et al.
- 1981
- IEEE T-ED
Dual-Electron-Injector-Structure Electrically Alterable Read-Only-Memory Modeling Studies
- D.J. Dimaria
- David W. Dong
- et al.
- 1981
- IEEE T-ED
The Effect of Concrete Shielding on Cosmic Ray Induced Soft Fails in Electronic Systems
- James F. Ziegler
- 1981
- IEEE T-ED
Resolution, Overlay, and Field Size for Lithography Systems
- Alec N. Broers
- 1981
- IEEE T-ED
The Pressure Dependence of the Bistable Voltage Margin of an AC Plasma Panel Cell
- Omesh Sahni
- M.O. Aboelefotoh
- 1981
- IEEE T-ED
I-2 Shallow Silicide Contact for Shallow Junction Devices
- K.N. Tu
- 1981
- IEEE T-ED
Optical Switching in Thin Film Electroluminescent Devices with Inherent Memory Characteristics
- Omesh Sahni
- Webster E. Howard
- et al.
- 1981
- IEEE T-ED
Memory-Cell Design in Josephson Technology
- Hans H. Zappe
- 1980
- IEEE T-ED