Effect of surface chemistry and work function in secondary ion mass spectrometry
- Ming L. Yu
- 1983
- JVSTA
Publications
3512 results for Materials Discovery
Fine-grained base electrode process for Pb-alloy Josephson technology
- A.A. Bright
- S. Klepner
- 1983
- JVSTA
A He-diffraction investigation of the p(2×2) and c(2×2) phases of oxygen on Ni(100)
- K.H. Rieder
- 1983
- Surface Science
Oxygen chemisorption and oxide formation on Si(111) and Si(100) surfaces
- G. Hollinger
- F.J. Himpsel
- 1983
- JVSTA
Importance of chain reactions in the plasma deposition of hydrogenated amorphous silicon
- Ivan Haller
- 1983
- JVSTA
Laser-induced gas-surface interactions
- T.J. Chuang
- 1983
- Surface Science Reports
Summary Abstract: Cluster formation and the percolation threshold in thin Au films
- R.B. Laibowitz
- E.I. Alessandrini
- et al.
- 1983
- JVSTA
Chemical bonding and Schottky barrier formation at transition metal-silicon interfaces
- Paul S. Ho
- 1983
- JVSTA
Correlation between the ion bombardment during film growth of Pd films and their structural and electrical properties
- P. Ziemann
- E. Kay
- 1983
- JVSTA
Schottky barrier formation at Pd, Pt, and Ni/Si(111) interfaces
- R.J. Purtell
- G. Hollinger
- et al.
- 1983
- JVSTA