Random distribution of islands explains the oscillatory intensity in He/Si(111)-(7 × 7)
- N. García
- J.M. Soler
- 1982
- Surface Science
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- Materials Discovery
3484 results for Materials Discovery
General aspects of barrier layers for very-large-scale integration applications I: Concepts
- P.S. Ho
- 1982
- Thin Solid Films
The use of titanium-based contact barrier layers in silicon technology
- C.-Y. Ting
- M. Wittmer
- 1982
- Thin Solid Films
Oxidation processes using ion beams
- A.W. Kleinsasser
- J.M.E. Harper
- et al.
- 1982
- Thin Solid Films
Interaction of inert gases with a nickel (100) surface. I. Adsorption of xenon
- K. Christmann
- J.E. Demuth
- 1982
- Surface Science
Radioactive Ni* tracer study of the nickel silicide growth mechanism
- J.E.E. Baglin
- H.A. Atwater
- et al.
- 1982
- Thin Solid Films
Comparison of the three classes (rare earth, refractory and near-noble) of silicide contacts
- R.D. Thompson
- K.N. Tu
- 1982
- Thin Solid Films
The direct observation of atomic surface structure and inclined planar defects in Au(111) films
- William Krakow
- 1982
- Thin Solid Films
Electron beam study of silicide Schottky diodes
- H.-C.W. Huang
- C.F. Aliotta
- et al.
- 1982
- Thin Solid Films
Electronic structure of silicide-silicon interfaces
- G.W. Rubloff
- P.S. Ho
- 1982
- Thin Solid Films