Tracer diffusion in amorphous Pd80Si20 and Gd16Co84 films
- D. Gupta
- K.N. Tu
- et al.
- 1982
- Thin Solid Films
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- Materials Discovery
3434 results for Materials Discovery
Low temperature doping of arsenic atoms in silicon during Pd2Si formation
- I. Ohdomari
- K. Suguro
- et al.
- 1982
- Thin Solid Films
Electronic states and microstructure at the silicide-silicon interface
- P.S. Ho
- G.W. Rubloff
- 1982
- Thin Solid Films
A computer calculation of step coverage in SiO thin films
- G.R. Proto
- I.A. Blech
- et al.
- 1982
- Thin Solid Films
Strain relaxation mechanisms of lead and lead alloy thin films on silicon substrates
- Masanori Murakami
- Tung-Sheng Kuan
- et al.
- 1982
- Thin Solid Films
The electronic structure of impurities and defects in SiO2
- Sokrates T. Pantelides
- 1982
- Thin Solid Films
Adsorbate band dispersions for C on Ru(0001)
- F.J. Himpsel
- K. Christmann
- et al.
- 1982
- Surface Science
R.F. Sputtering of LiNbO3 thin films
- G.H. Hewig
- K. Jain
- et al.
- 1982
- Thin Solid Films
An iterative method for calculating hard-wall diffraction intensities
- Robert H. Swendsen
- K.H. Rieder
- 1982
- Surface Science
Weak localization in indium oxide films
- Z. Ovadyahu
- S. Moehlecke
- et al.
- 1982
- Surface Science