Raman Spectroscopy of Silicide Formation at the Pt/Crystalline Si Interface
- J.C. Tsang
- G.W. Rubloff
- et al.
- 1984
- JVSTA
Paper
Publications
3555 results for Materials Discovery
A simple bearing for horizontal rotation of heavy equipment in UHV
- W. Stocker
- K.H. Rieder
- 1984
- JVSTA
PaperGeometric structure and electronic states of copper films on a ruthenium (0001) surface
- J.C. Vickerman
- K. Christmann
- et al.
- 1983
- Surface Science
PaperTransmission electron microscopy for optical storage material analysis
- S.R. Herd
- K.Y. Ahn
- 1983
- Thin Solid Films
PaperFabrication and testing of trilayers with a high deposition rate plasma-polymerized spacer
- N.J. Mazzeo
- K.Y. Ahn
- et al.
- 1983
- Thin Solid Films
PaperThe stability of thin tellurium and tellurium alloy films for optical data storage: II
- Wen-Yaung Lee
- 1983
- Thin Solid Films
PaperDepletion and retention of fluid on a rotating disk
- Yih-O. Tu
- 1983
- Journal of Tribology
PaperCharacterization of plasma-deposited organosilicon thin films
- Krishna G. Sachdev
- Harbans S. Sachdev
- 1983
- Thin Solid Films
PaperSilicide contacts for shallow junction devices
- Marc Wittmer
- 1983
- Thin Solid Films
PaperInvestigation of Tin films reactively sputtered using a sputter gun
- K.Y. Ahn
- M. Wittmer
- et al.
- 1983
- Thin Solid Films
Paper