Atomic force microscope: Implementations
- P.C.D. Hobbs
- Y. Martin
- et al.
- 1989
- Proceedings of SPIE 1989
Conference paper
Publications
3602 results for Mathematical Sciences
Scanning Near-Field Optical Microscopy (SNOM*): Basic Principles and Some Recent Developments
- U.C. Fischer
- U. Dürig
- 1989
- Proceedings of SPIE 1989
Conference paperHigh-Resolution Capacitance Measurement By Force Microscopy: Application To Sample Characterization And Potentiometry
- David W. Abraham
- Yves Martin
- et al.
- 1989
- Proceedings of SPIE 1989
Conference paperSome history and technology of scanning microscopy
- H.K. Wickramasinghe
- 1989
- Proceedings of SPIE 1989
Conference paperA topological perspective on the structure of images
- A. Peter Blicher
- 1989
- Proceedings of SPIE 1989
Conference paperResolution of overlapping spectra using frequency-domain fluorometry
- Beniamino F. Barbieri
- Fabio De Piccoli
- et al.
- 1989
- Proceedings of SPIE 1989
Conference paperThe psychophysics of spatial sampling
- Bernice E. Rogowitz
- 1989
- Proceedings of SPIE 1989
Conference paperA simple metal pn polymer process using pulsed electron beams in soft vacuum
- J. Krishnaswamy
- Mark Eyolfson
- et al.
- 1989
- Proceedings of SPIE 1989
Conference paperFully scaled 0.5 micron CMOS technology using variable shaped electron beam lithography
- Philip Coane
- Paul Rudeck
- et al.
- 1989
- Proceedings of SPIE 1989
Conference paperContrast and sensitivity trade-offs of resist processing in electron beam lithography at 0.5µm and below
- W. Molzen
- Michael G. Rosenfield
- et al.
- 1989
- Proceedings of SPIE 1989
Conference paper